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In keeping with the tradition of recent EURING technical meetings, we will devote
one day (Monday, October 6) to a series of 'short courses', designed to introduce,
or in some case, reinforce, some of the concepts relevant to the analysis of data
from marked individuals. In previous meetings, the short-courses attempted to
provide a fairly holistic coverage, from first principles of multinomial
likelihoods, basics of linear models, ultrastructural extensions to standard
models, as well as some discussion of more advanced methods (e.g., random
effects).
For the EURING 2003 short-courses, we will adopt a slightly different approach, favouring depth of coverage over diversity of topics. Specifically, the 2003 short-courses will focus on only 3 topics: (i) parameter counting & redundancy, (ii) goodness-of-fit testing, and (ii) Bayesian inference. All three of these topics are of considerable interest: the first 2 for very practical reasons, regardless of the approach you take in your analyses, and the latter reflecting a growing interest in the use of Bayesian methods for complex problems. While many attending EURING 2003 will have some level of familiarity with one or more of these topics, the design and intent of the short-courses is to ensure some common level of understanding, as much as possible, in advance of the formal papers later in the week (many of which make use of, or rely upon, one or more of these subjects). The tentative schedule for the EURING 2003 short-courses, along with a list of instructors who have either agreed, or whom we have solicited, to lead discussions, is shown below:
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